| Paper | Title | Page |
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TUPA40 |
High Resolution Bunch Profile Determination with an X-band Deflecting Cavity | |
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| The determination of the longitudinal profile of high-brightness beams on the ~fs scale is important for many present-day applications that employ ultra-short beams. A direct method to measure the beam profile in the temporal domain utilizes a transverse cavity operating in the zero-crossing mode. Here we present the development and commissioning results of an x-band deflecting cavity that is currently installed at the Brookhaven National Laboratory Accelerator Test Facility. Initial studies and simulations show that a temporal resolution of <10fs is achievable. In addition, we propose a method to enhance this resolution to the sub-fs scale with the addition of a laser-modulator (a high-power laser and an undulator) to impose an angular modulation on the beam. This modulation, in tandem with the transverse cavity, is resolvable on a distant screen; simulations show that temporal resolutions on the sub-fs scale are achievable. | ||