Author: Schlott, V.
Paper Title Page
MOPA44
Coherent Optical Transition Radiation at the SwissFEL Injector Test Facility  
 
  • B. Smit, M. Aiba, S. Bettoni, B. Beutner, R. Ischebeck, G.L. Orlandi, E. Prat, L. Rivkin, T. Schietinger, V. Schlott
    PSI, Villigen, Switzerland
 
  SwissFEL uses magnetic dispersive sections for bunch compression, which may cause micro-bunching within the electron bunch. Studies of Coherent Optical Transition Radiation (COTR) allow us to see whether or not such bunching is present. We present pilot results of COTR experiments carried out at the SwissFEL Injector Test Facility. Optical transition radiation is generated at an aluminium-coated silicon wafer that can be inserted into the beam. This can either be imaged to a CCD camera, or focused into a spectrometer with a spectral range from 200 nm to 925 nm. The compression of the electron bunches was varied, and data was recorded at different bunch lengths. Spectral data shows a clear gain of the signal and a shift towards the infrared for a stronger compression of the bunches. Results indicate that the spectrum fluctuates at maximum compression. This is consistent with fluctuations observed in COTR images.  
 
MOPB87 Development and First Tests of a High Sensitivity Charge Monitor for SwissFEL 1
 
  • S. Artinian, J.F. Bergoz, F. Stulle
    BERGOZ Instrumentation, Saint Genis Pouilly, France
  • P. Pollet, V. Schlott
    PSI, Villigen, Switzerland
 
  The compact X-ray free electron laser SwissFEL, which is presently under development at the Paul Scherrer Institut (PSI) in Villigen, Switzerland, will operate at comparably low charges, allowing the compression of the electron bunches to a few femto-seconds (nominal 200 pC mode) and even towards the atto-second range (short bunch 10 pC mode). A high precision charge measurement turns out to be a challenge, especially in the presence of dark currents, which may occur from high gradient RF gun and accelerating structure operation. In response to this challenge, a higher sensitivity charge transformer and new beam charge monitor electronics were developed in collaboration between Bergoz Instrumentation and PSI. The Turbo-ICT captures sub-pC bunch charge thanks to a new magnetic alloy exhibiting very low core loss. Transmission over a carrier using narrow-band cable television technique preserves the signal integrity from the Turbo-ICT to the BCM-RF. Electro-magnetic and RF interferences are strongly attenuated; the dark current signal is suppressed. First beam test results, which have been performed at the SwissFEL Test Injector Facility (STIF), are presented in this contribution.  
 
TUCC03 Design and Expected Performance of the New SLS Beam Size Monitor 1
 
  • N. Milas, M. Rohrer, A. Saa Hernandez, V. Schlott, A. Streun
    PSI, Villigen, Switzerland
  • Å. Andersson, J. Breunlin
    MAX-lab, Lund, Sweden
 
  The vertical emittance minimization campaign at SLS, realized in the context of the TIARA WP6, has already achieved the world's smallest vertical emittance of 0.9 pm in a synchrotron light source. The minimum value reached for the vertical emittance is only five times bigger than the quantum limit of 0.2 pm. However, the resolution limit of the present SLS emittance monitor has also been reached thus, to further continue the emittance minimization program the construction of an improved second monitor is necessary. In this paper we present the design and studies on the performance of this new monitor based on the image formation method using vertically polarized synchrotron radiation in the vis-UV spectral regimes. This monitor includes a new feature, providing the possibility of performing full interferometric measurement by the use of a set of vertical obstacles that can be driven on the light path. Simulations results are used to investigate the possible source of errors and their effects on imaging and the determination of the beam height. We also present the expected performance, in term of emittance accuracy and precision, and discuss possible design limitations.  
slides icon Slides TUCC03 [8.497 MB]  
 
MOPB82 Bunch-Compressor Transverse Profile Monitors of the SwissFEL Injector Test Facility 1
 
  • G.L. Orlandi, M. Aiba, S. Bettoni, B. Beutner, H. Brands, R. Ischebeck, P. Peier, E. Prat, T. Schietinger, V. Schlott, V.G. Thominet
    PSI, Villigen, Switzerland
  • C. Gerth
    DESY, Hamburg, Germany
 
  The 250 MeV SwissFEL Injector Test Facility (SITF) is the test bed of the future 5.7 GeV SwissFEL linac that will drive a coherent FEL light source in the wavelength range 7-0.7 and 0.7-0.1 nm. Aim of the SITF is to demonstrate the technical feasibility of producing and measuring 10 or 200pC electron bunches with normalized emittance down to 0.25 μm. A further goal is to demonstrate that the electron beam quality is preserved in the acceleration process, in the X-Band linearizer and the magnetic compression from about 10 ps down to 200 fs. The SITF movable magnetic bunch-compressor is equipped with several CCD/CMOS cameras for monitoring the beam transverse profile and determining the beam energy spread: a Ce:YAG screen and an OTR screen camera at the mid-point of the bunch compressor and a SR camera imaging in the visible the Synchrotron Radiation emitted by the electron beam crossing the third dipole. Results on the commissioning of such instrumentations, in particular in the low charge limit, and measurements of the beam energy spread vs. the compression factor will be presented.  
 
TUPB80
Transverse Profile Monitor for SwissFEL  
 
  • R. Ischebeck, B. Beutner, E. Prat, V. Schlott, V.G. Thominet
    PSI, Villigen, Switzerland
 
  In future free electron lasers, electron and photon beam sizes range between 10 um and a few millimeters. For an initial set up of the accelerator, to confirm target parameters for optics and emittance, and to optimize the FEL for different user requests, the transverse profile of these beams has to be determined. A monitor based on a scintillating crystal as well as optical transition radiation (for the electron beam) has been designed for the SwissFEL project. It features a projected pixel size of 7 micrometers, a good resolution over a field of view of 6 mm x 15 mm, a good sensitivity (as required for the low-charge mode of SwissFEL) and a 100 Hz image readout. To test the monitor, it has been installed at the SwissFEL Injector Test Facility, where electron bunches between 10 and 200 pC can be generated. In conjunction with a transverse deflecting cavity, the profile monitor has been used to measure the time-resolved slice emittance of these bunches.